| LPCOpen Platform v1.03 LPCOpen Platform for NXP LPC Microcontrollers

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MEM_TEST_SETUP_T Struct Reference
CHIP: Various RAM memory tests

## Detailed Description

Memory test address/size and result structure.

Definition at line 47 of file mem_tests.h.

`#include "mem_tests.h"`

## Data Fields
uint32_t * | start_addr
uint32_t | bytes
uint32_t * | fail_addr
uint32_t | is_val
uint32_t | ex_val

## Field Documentation

uint32_t bytes

Size in bytes for memory test

Definition at line 49 of file mem_tests.h.

uint32_t ex_val

Expected value of test (returned only if failed)

Definition at line 52 of file mem_tests.h.

uint32_t* fail_addr

Failed address of test (returned only if failed)

Definition at line 50 of file mem_tests.h.

uint32_t is_val

Failed value of test (returned only if failed)

Definition at line 51 of file mem_tests.h.

uint32_t* start_addr

Starting address for memory test

Definition at line 48 of file mem_tests.h.

The documentation for this struct was generated from the following file:

- C:/nxp/v1.03/lpcopen_v1.03/lpcopen/software/lpc_core/lpc_chip/chip_common/mem_tests.h