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A practical approach to system
reliability growth modeling and improvement
Yadav,
O.P. Singh, N. Goel, P.S.
Dept. of Ind. & Manuf. Eng., Wayne
State Univ., Detroit, MI, USA;
This paper appears in: Reliability and
Maintainability Symposium, 2003. Annual
Publication Date: 2003
On page(s): 351- 359
ISSN: 0149-144X
Number of Pages: xviii+622
Abstract:
In a product development process, to develop
appropriate design validation and verification program for
reliability assessment, one has to understand the functional
behavior of the system, role of components in achieving required
functions and failure modes if component/sub-system fails to perform
required function. In this paper, the authors propose a simple and
practical two-stage approach of system reliability growth modeling
considering components, functions, and failure modes. The
consideration of these three dimensions will help in uncovering the
weak spots in design responsible for low system reliability. The
proposed method assumes Weibull distribution as failure time
distribution and reliability model is based on the Bayesian
framework incorporating even fuzzy information. The fuzzy logic
model that has been developed for this purpose is used to quantify
the engineering judgment or fuzzy information of reliability
improvement attributed to design changes or corrective actions.
Uncertainty in data/information at component levels propagates to
system level reliability and makes system reliability prediction
highly unreliable. The paper suggests a variance reduction strategy
to give more accurate system reliability predictions.
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