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Design of accelerated reliability tests
based on simple-step-stress model
Takemoto,
Y. Arizono, I.
Osaka Prefecture Univ., Japan;
This paper appears in: Reliability and
Maintainability Symposium, 2003. Annual
Publication Date: 2003
On page(s): 111- 116
ISSN: 0149-144X
Number of Pages: xviii+622
Abstract:
The accelerated life tests can obtain
information on lifetime characteristics of products quickly. Then,
the products can be submitted to higher levels of stress in various
ways such as constant, step, and progress stress. In a
constant-stress model, products are run under a constant level of
stress until all products fail or a time limit is reached. A
step-stress model allows the stress setting to be changed at a
prescribed time or upon the occurrence of a fixed number of
failures. In a progress-stress model, the stress is continuously
increased over time. Until now, under the assumption of the
functional relationship between the parameters of lifetime
distribution and applied stress, there are many studies about
parameter estimation using data obtained from an accelerated life
test. In this study, instead of the parameter estimate problem, the
authors consider a new design procedure of accelerated life tests
based on the simple-step-stress model for assuring the mean time to
failure (MTTF) at usual stress with specified producer and consumer
risks under the condition that the parameters of the lifetime
distribution at two stress levels are provided. The practical usage
of the proposed design procedure is illustrated through some
numerical examples.
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