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Reliability tests on power
devices
Marcos, J. Pallas,
J.M.L. Fernandez-Gomez, S.
Vigo Univ.;
This paper
appears in: Reliability and Maintainability Symposium, 2002.
Proceedings. Annual
Meeting
Date: 01/28/2002 -01/31/2002
Publication
Date: 2002
Location:
Seattle, WA ,
USA
On page(s):
618-621
References Cited:
10
IEEE Catalog Number:
02CH37318
Number of Pages:
xxiv+658
Abstract:
System dependability has become an important
aspect to consider because of the large number of components
included in modern systems and the high availability requirements
that users demand. In systems such as switch-mode power supplies,
power devices like IGBTs play a fundamental role in system
functionality and performance, hence the use of reliable components
is key. In this paper, the design of dependable systems based on
reliable power devices is addressed. Reliability tests have been
carried out on a set of IGBTs used in a battery charger to extract
accurate reliability prediction models for this type of devices and
degradation models, which can help the system designer to generate
highly dependable systems. This paper describes the first phase of
the authors' research that focus on determining degradation models
for IGBTs due to environmental causes. Their tests show the high
resistance of the selected devices to environmental stress. None of
the devices has failed the tests, and the variation in their
electrical characteristics is minimal. This is an important
conclusion because our final objective is the design of reliable
battery chargers, which requires the use of power devices that can
tolerate high stress without degradation of their characteristics.
In addition, they were able to detect a flaw in their measurement
methodology that helped them to improve their test and analysis flow
for the second phase of their research
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