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A Bayes approach to step-stress
accelerated life testing
Rene van Dorp,
J. Mazzuchi, T.A. Fornell,
G.E. Pollock, L.R.
George Washington Univ., Washington, DC;
This paper appears in: Reliability,
IEEE Transactions on
Publication Date: Sep 1996
On page(s): 491-498
Volume: 45, Issue:
3
ISSN:
0018-9529
References Cited:
19
CODEN: IERQAD
Abstract:
This paper develops a Bayes model for
step-stress accelerated life testing. The failure times at each
stress level are exponentially distributed, but strict adherence to
a time-transformation function is not required. Rather, prior
information is used to define indirectly a multivariate prior
distribution for the failure rates at the various stress levels. Our
prior distribution preserves the natural ordering of the failure
rates in both the prior and posterior estimates. Methods are
developed for Bayes point estimates as well as for making
probability statements for use-stress life parameters. The approach
is illustrated with an example
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