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Analyzing accelerated degradation data
by nonparametric regression
Jyh-Jeu Horng
Shiau Hsin-Hua Lin
Nat. Chiao Tung Univ., Hsinchu;
This paper appears in: Reliability, IEEE
Transactions on
Publication Date: Jun 1999
On page(s): 149-158
Volume: 48, Issue:
2
ISSN:
0018-9529
References Cited:
14
CODEN: IERQAD
Abstract:
This paper presents a nonparametric regression
accelerated life-stress (NPRALS) model for accelerated degradation
data wherein the data consist of groups of degrading curve data. In
contrast to the usual parametric modeling, a nonparametric
regression model relaxes assumptions on the form of the regression
functions and lets data speak for themselves in searching for a
suitable model for data. NPRALS assumes that various stress levels
affect only the degradation rate, but not the shape of the
degradation curve. An algorithm is presented for estimating the
components of NPRALS. By investigating the relationship between the
acceleration factors and the stress levels, the mean time to failure
estimate of the product under the usual use condition is obtained.
The procedure is applied to a set of data obtained from an
accelerated degradation test for a light emitting diode product. The
results look very promising. The performance of NPRALS is further
checked by a simulated example and found satisfactory. We anticipate
that NPRALS can be applied to other applications as well
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