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Assessment of fault-detection
processes: an approach based on reliability
techniques
Morasca, S.
Dipartimento di Elettronica e Inf., Politecnico di
Milano;
This paper appears
in: Reliability, IEEE Transactions on
Publication Date: Dec 1996
On page(s): 632-637
Volume: 45, Issue:
4
ISSN:
0018-9529
References Cited:
7
CODEN: IERQAD
Abstract:
Two major factors influence the number of faults
uncovered by a fault-detection process applied to a software
artifact (e.g., specification, code): ability of the process to
uncover faults, quality of the artifact (number of existing faults).
These two factors must be assessed separately, so that one can:
switch to a different process if the one being used is not effective
enough, or stop the process if the number of remaining faults is
acceptable. The fault-detection process assessment model can be
applied to all sorts of artifacts produced during software
development, and provides measures for both the `effectiveness of a
fault-detection process' and the `number of existing faults in the
artifact'. The model is valid even when there are zero defects in
the artifact or the fault-detection process is intrinsically unable
to uncover faults. More specifically, the times between fault
discoveries are modeled via reliability-based techniques with an
exponential distribution. The hazard rate is the product of
`effectiveness of the fault-detection process' and `number of faults
in the artifact'. Based on general hypotheses, the number of faults
in an artifact follows a Poisson distribution. The unconditional
distribution, whose parameters are estimated via maximum likelihood,
is obtained
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