IEEE HomeSearch IEEE ShopWeb Account Contact IEEE IEEE
MembershipPublications/ServicesStandardsConferencesCareers/Jobs  
IEEE Xplore  
Help    FAQ   Terms   IEEE Peer Review
»Abstract  
Welcome to IEEE Xplore
Home
What Can I Access?
Log-out
Tables of Contents
Journals & Magazines
Conference Proceedings
Standards
K2 Search
By Author
Basic
Advanced
Member Services
Join IEEE


VIEW TOC    [PDF Full-Text (788 KB)]    PREV   NEXT   ABSTRACT PLUS   
You are not currently logged in. Guests may access abstract/citation records free of charge. Click here to log in.

You may purchase the PDF full-text document for up to three (3) downloads within 30 days.


Empirically based analysis of failures in software systems
Selby, R.W.  
Dept. of Inf. & Comput. Sci., California Univ., Irvine, CA;
This paper appears in: Reliability, IEEE Transactions on

Publication Date: Oct 1990
On page(s): 444-454
Volume: 39,   Issue: 4 
ISSN: 0018-9529
References Cited: 45
CODEN: IERQAD

Abstract:
An empirical analysis of failures in software systems is used to evaluate several specific issues and questions in software testing, reliability analysis, and reuse. The issues examined include the following: diminishing marginal returns of testing; effectiveness of multiple fault-detection and testing phases; measuring system reliability versus function or component reliability; developer bias regarding the amount of testing that functions or components will receive; fault-proneness of reused versus newly developed software; and the relationship between degree of reuse and development effort and fault-proneness. Failure data from a large software manufacturer and a NASA production environment were collected and analyzed

VIEW TOC    [PDF Full-Text (788 KB)]    PREV   NEXT   ABSTRACT PLUS   

Home | Log-out | Journals | Conference Proceedings | Standards | Search by Author | Basic Search | Advanced Search Join IEEE | Web Account | New this week | OPAC Linking Information | Your Feedback | Technical Support | Email Alerting No Robots Please | Release Notes | IEEE Online Publications | Help | FAQ| Terms | Back to Top

Copyright © 2004 IEEE — All rights reserved