TEST 10
    The circuit is now set up and programmed. The stimulus applied
    at the I/P is an interrogation A5-5 which is what was programmed
    into the chip on test 9. The Scope is connected to the O/P burst
    and a timing ref out of the ANT. The turn around time can be
    finely adjusted using RV5.
	The second part of the test checks that the timing is correct
    by testing with pulses which are only just in the window by 0.05ms.
    The next two tests offsets both frequencies to chaec the tuned 
    circuits have been properly set up.
    	The ANT unit is tuned to listen for TZ5. The internal registers
    of the ANT are read to see if a valid reply has been received and 
    what the measured turn around is. 

Faultfinding:
No O/P - look on TP10 this gives timing pulses and is a window on
         what is going on in the micro. It should look like this:
       ────┬┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬─┬──┬
           ││ │ │ │ │ │ │ │ │ │ │ │ │ │ │ │ │ │ │ │ │ │ │  │
    address 1 2 3 4 5 6 7 8 9   11  13  15  17  19  21  23 Reply

 If it looks like this: Then EEPROM U7 is not programmed   
       ────┬┬─┬─┬─┬─┐
           ││ │ │ │ │______________________________________
   
    address 1 2 3 4 5 6 7 8 9   11  13  15  17  19  21  23

       U7 Pin 8 is the switched supply pin. This should go high for programming
          Pin 6 clock pulses
          Pin 5 data pulses
       When the fault is found return to test 9 and program


