/* * David Muller; Germán Alfaro * davehmuller@gmail.com; alfaro.germanevera@gmail.com * * Thom Maughan; tm@mbari.org 2018... */ #ifndef MPHOX_SYSTEM_H_ #define MPHOX_SYSTEM_H_ #include #include #include #include #include #include #include #include #include #if BOARD_MFET >= 1 || BOARD_MPHOX == 1 #include "inc/tm4c123gh6pge.h" #endif #if BOARD_NANOFET == 1 #include "inc/tm4c123gh6pm.h" #endif #include "inc/hw_memmap.h" #include "inc/hw_types.h" #include "inc/hw_hibernate.h" #include "driverlib/debug.h" #include "driverlib/fpu.h" #include "driverlib/gpio.h" #include "driverlib/pin_map.h" #include "driverlib/rom.h" #include "driverlib/rom_map.h" #include "driverlib/sysctl.h" #include "driverlib/uart.h" #include "driverlib/eeprom.h" #include "driverlib/gpio.h" #include "driverlib/hibernate.h" #include "driverlib/ssi.h" #include "driverlib/interrupt.h" //V=I*R => V=I*15K => I=V/15K amps => I=V*10^9/15K nano-Amps => I=V*66.6k nA => 15uV/nA. #define COUNTERELECTRODE_IK_SCALE 66666.667 // 10^9/15K MCAP has 15K resistor, Ik // #define SUBSTRATECURRENT_IB_SCALING 1000 // 10^9/1M = 1000 MCAP has 1M resistor for Ib, substrate current #define SIZEOF_PRNBUF 1020 #if BOARD_MFET == 1 #define VERSION "v3.7.1 was the last support for MFET v1" // MFET software version Glider is 9600 baud // battery backed HIB, no FRAM // only one can be set to 1. HIB uses battery backed ram in hibernate module, EEPROM uses onchip EEPROM with 500K cycles, FRAM requires 24CL04B chip on MFET v2 #define NONVOLATILEMEM "Nonvol mem: Hibernate module battery backed RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 1 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 0 #endif #if BOARD_MFET == 2 #define VERSION "v3.9.2 MFET revC" // MFET software version Glider is 9600 baud // FRAM (and battery backed HIB) #define NONVOLATILEMEM "Nonvol mem: i2c Ferroelectric RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 0 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 2 // was 1, 2 means use of sys_samp #endif #if BOARD_MPHOX == 1 #define VERSION "v3.9.2 MpHOx revB" // MFET software version Glider is 9600 baud // FRAM (and battery backed HIB) #define NONVOLATILEMEM "Nonvol mem: i2c Ferroelectric RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 0 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 2 // was 1 (sys_samp) #endif #if BOARD_NANOFET == 1 #define VERSION "v3.9.2 NanoFET pre-release" // MFET software version Glider is 9600 baud // FRAM (and battery backed HIB) #define NONVOLATILEMEM "Nonvol mem: i2c Ferroelectric RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 0 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 2 #endif #ifndef VERSION #define VERSION "COMPILER FLAGS BOARD_MFET or BOARD_MPHOX or BOARD NANOFET NOT DEFINED" #endif #define NOMINAL_SAMPLE_TIMES 1 #define FAST_SAMPLE_TIMES 0 /* Boolean type */ typedef enum { FALSE = 0, TRUE } BOOL; typedef enum {IDLE, START, DEPLOYED, COMMAND} deploy_state; typedef enum {NORMAL=1, VERBOSE} output_mode; /* * Delay lengths for SysCtlDelay(). */ #define CLOCKSPEED 50000000.0 //clock is set to run at 50MHZ #define ONESEC (int)ceil((CLOCKSPEED/3.0)) //SysCtlDelay takes 3 cycles per loop...so delay = DesiredDelayTimeInSeconds/((1/CLOCKSPEED)*3) #define MILLISECOND (int)ceil((.001 / ((1.0/CLOCKSPEED)*3.0))) #define MICROSECOND (int)ceil((.000001 / ((1.0/CLOCKSPEED)*3.0))) /* * Buffer lengths. */ #define TIMESTAMPLENGTH 50 #define INSTRUMENTBUFFSIZE 400 #define MICROCAT_BUFFER_SIZE 128 #define DBG_UART_BUFFER_SIZE 128 // buffer defined in microcat.h microcat sbe37 is on uart4 #define OPTODE_BUFFER_SIZE 128 // buffer defined in optode.h optode is on uart3 #define CTD_BUFFER_SIZE 128 #define AUX1_BUFFER_SIZE 128 #define AUX2_BUFFER_SIZE 128 #define GDATA_BYTES 512 // Number of bytes to read out with gdata command #define IS_PRESENT 1 #define NOT_PRESENT 0 /* * Constants */ #define R_ 8.31451 // Univ gas constant #define F_ 96487 // Faraday constant #define dEoINT_dt -0.0011012 // Temperature coefficient for internal reference [Volts/C] #define dEoEXT_dt -0.0010482 // Temeprature coefficient for external reference [Volts/C] #define LN10 2.302585 // Natural log of 10 // Standard deviation array values #define SD_AVG 5 #define SD_MEAN SD_AVG #define SD_DIFF_SQ SD_AVG+1 #define SD_VALUES 5 // AD1248 24-bit A/D defines // signed 24bit numeric range is: -8,388608 to +8,388607 #define TWOTOTHE23 8388608 // 2 to the 23rd = 8388608 #define COUNTSTOVOLTS (float) (2.048 / (TWOTOTHE23 - 1)) //each count returned from the ADC has a weight of (Vref/PGA)/(2^23 -1 ). We use PGA = 1. #define PGA_1 0x00 #define PGA_2 0x10 #define PGA_4 0x20 #define PGA_8 0x30 #define PGA_16 0x40 #define PGA_32 0x50 #define PGA_64 0x60 #define PGA_128 0x70 #define SPS_5 0x00 #define SPS_10 0x01 #define SPS_20 0x02 #define SPS_40 0x03 #define SPS_80 0x04 #define SPS_160 0x05 #define SPS_320 0x06 #define SPS_640 0x07 #define SPS_1000 0x08 #define SPS_2000 0x09 #define VTHERM_TRIALS 5 #define VTHERM_SPS 20 #define VRSI_TRIALS 10 #define VRSI_SPS 20 #define VRSE_TRIALS 10 #define VRSE_SPS 20 #define IK_TRIALS 1 #define IK_SPS 20 #define VK_TRIALS 5 #define VK_SPS 20 #define IB_TRIALS 1 #define IB_SPS 20 #define VB_TRIALS 5 #define VB_SPS 20 #define VBIAS_TRIALS 1 #define VBIAS_SPS 40 /* * Definition of a structure containing the controller's parameters * These parameters are all modifiable by external user except where noted. * Structure is stored in EEPROM during hibernation. */ #define MAX_NUMOF_CONFIG_FIELDS 32 //was 30 These are for sampling / data logging configuration A-Z, 0-9 #define MAX_NUMOF_APP_CONFIG_FIELDS 8 #define MAX_FILENAME 16 // 8.3 filename plus padding 24 //80 is too much, should be 32 or 40 at most. #define MAX_USER_INITIALS 8 #define MAX_TESTER_NAME 48 #define MAX_VERSION_SIZE 32 #define MAX_BOARD_SN 24 //30 #define MAX_MCAP_SN 24 //30 #define MAX_PACKAGE_NAME 32 //30 #define MAX_DURAFET_SN 24 //30 #define MAX_CAPADAP_SN 24 //30 #define MAX_ISE_SN 24 //30 #define MAX_OPTODE_SN 24 //30 #define MAX_CTD_SN 24 //30 #define MAX_PUMP_SN 24 //30 #define MAX_BOARD_FABNOTE 80 #define MAX_DEPLOY_NOTE 80 struct qaData { uint32_t microSD; // microSD uint32_t time; // time of QA uint32_t test_time; // time it took to run QA uint32_t eeprom; // size of sys_data in eeprom, 0 if there is a problem uint32_t sys_data_init; // was the data initialized uint32_t fram; uint32_t adc12onchip; uint32_t adc24; // how many of the ADC fields are out of expected Jensenian range float Vrsi; float Vrsi_std; float Vrsi_err; float Vrse; float Vrse_std; float Vrse_err; float Vtherm; float Vtherm_std; float Vtherm_err; float Ik; float Ik_std; float Ik_err; float Vk; float Vk_std; float Vk_err; float Ib; float Ib_std; float Ib_err; float Vb; float Vb_std; float Vb_err; float Vbias_pos; float Vbias_neg; uint32_t aux_pwr1; uint32_t aux_pwr2; uint32_t aux_pwr3; uint32_t ctd; uint32_t optode; uint32_t comm_pwr; char tester[MAX_TESTER_NAME]; char firmware_version[MAX_VERSION_SIZE]; }; // systemData struct organized for 4 byte packing, also fixed buffer overruns by setting size of fields in define struct systemData { //---------------- samplingData --------------------------- uint32_t sampling_period; //8 pH sampling period uint32_t sample_average; // DEPRECATED (was int32_t) 12 Number of pH sensor samples to average uint32_t averaging_interval; //16 Number of seconds between each average uint32_t pumpon_time; //20 Active pump time float low_batt_volt; //4 Low battery voltage threshold float TCOffset; //24 DuraFET temperature calibration variable float k0ext; //28 was float Eo_ext_25C;, renamed k0ext 2 Apr 2021 float k0int; //32 was float Eo_int_25C;, renamed k0int 2 Apr 2021 float k2ext; //28 added 25 Apr 2021 float k2int; //32 added 25 Apr 2021 double quadTherm_c0; // 4 coefficient c0 for thermistor double quadTherm_c1; // 4 coefficient c1 for thermistor double quadTherm_c2; // 4 coefficient c2 for thermistor double quadTherm_c3; // 4 coefficient c3 for thermistor double shTherm_A; // steinhart-hart coefficient A double shTherm_B; // steinhart-hart coefficient C double shTherm_C; // steinhart-hart coefficient B float default_sal; //36 default salinity (FRAM) TODO float sensor_sal; // salinity read from conductivity (SBE, Aanderaa) uint32_t Vrsi_sps; //Vrsi_sps //418 pH Vint data rate setting (sps) uint32_t Vrsi_trials; //Vrsi_trials uint32_t Vrse_sps; uint32_t Vrse_trials; uint32_t Vtherm_sps; uint32_t Vtherm_trials; uint32_t Ik_sps; uint32_t Ik_trials; uint32_t Vk_sps; uint32_t Vk_trials; uint32_t Ib_sps; uint32_t Ib_trials; uint32_t Vb_sps; uint32_t Vb_trials; uint32_t Vbias_sps; uint32_t Vbias_trials; uint32_t offset_Ik; // 800uV or so, tbd measure a QA step. uint32_t offset_Ib; output_mode output; //422 Verbose mode during deployment if true (enum is 4 bytes?) uint32_t test_mode; //426 Indicates test deployment uint32_t fast_mode; // Future: changed to sampling mode (fast, precise, etc.) uint32_t solenoid_on2hold_msec; uint32_t solenoid_hold_pwm; uint32_t solenoid_holdtime; // new 20 Jul 2021 uint32_t baud_rate; //470 baud rate (added by tm Jul 2018) unsigned char data_cfg[MAX_NUMOF_CONFIG_FIELDS]; //510 was 30, changed to 40 34 data field / logging configuration (added by tm Jul 2018) unsigned char app_cfg[MAX_NUMOF_APP_CONFIG_FIELDS]; bool GMT; //456 GMT or Local time bool sample_aligned; //460 Sample aligned to hour uint32_t deploy_time; // deployment time (Todo FRAM) uint32_t diag; // diagnostic flag, for developer uint32_t debug_flag; // turn on diagnostic debug printf's // was float spare[9]; float pHOffset; // new 3 Aug 2021 (speculative placeholders, can be used as spare) float pHSlope; float TCSlope; float sensor_ctd_TC; float sensor_optode_TC; float spare[4]; // 4 (was 9) 4 byte spares (36 bytes) for future expansion without causing EEPROM struct issues //------------------ System MetaData ------------------ // re-arranged struct to put char fields after numeric char fileName[MAX_FILENAME]; //116 The name the user would like to give their data output file, fatfs max is 8.3 char user[MAX_USER_INITIALS]; //452 User initials char board_SN[MAX_BOARD_SN]; //146 (added 3Apr2021) board (MFET, MpHOx, nanoFET) serial number char mcap_SN[MAX_MCAP_SN]; //176 (added 3Apr2021) mcap serial number char durafet_SN[MAX_DURAFET_SN]; //226 DuraFET sensor serial number char package_name[MAX_PACKAGE_NAME]; //196 Name of integrated package (underway system, etc.) (was 20, now 30, bug in buff entry size) char optode_SN[MAX_OPTODE_SN]; //346 (added 3Apr2021) Aanderaa optode serial number char ctd_SN[MAX_CTD_SN]; //376 (added 3Apr2021) Aanderaa conductivity or MicroCat aka ctd serial number char pump_SN[MAX_PUMP_SN]; //406 Pump serial number char board_fab_note[MAX_BOARD_FABNOTE]; // (added 4Apr2021) board fabrication notes, dates, etc. char deploy_note[MAX_DEPLOY_NOTE]; // (Todo FRAM) struct qaData qa; }; struct systemSamplingData { int32_t state; //430 IDLE, DEPLOYED, COMMAND, NOT USER MODIFIABLE <<<<<------ uint32_t nextWakeUp; //434 Next intended RTC match (wake-up time) NOT USER MODIFIABLE <<<<<------ uint32_t next_gdata_fptr; //438 The file position of the next gdata sample. NOT USER MODIFIABLE <<<<<------ uint32_t current_sample; //442 The current data record to be stored. NOT USER MODIFIABLE <<<<<------ float AD24_std; //464 standard deviation for AD24 <<<<-------- uint32_t initNum; }; // variables that change each sample (will wear out onchip 500k write cycle flash / eeprom) struct systemDataVolatile { uint32_t state; // IDLE, DEPLOYED, COMMAND, NOT USER MODIFIABLE uint32_t nextWakeUp; // Next intended RTC match (wake-up time) NOT USER MODIFIABLE uint32_t next_gdata_fptr; // The file position of the next gdata sample. NOT USER MODIFIABLE Note: was unsigned long uint32_t current_sample; // The current data record to be stored. NOT USER MODIFIABLE float AD24_std; uint32_t samp_state; uint32_t chksum; }; struct keytapeVars { uint32_t headPtr; uint32_t tailPtr; }; #define SYSDATACHG_NUMWORDS 7 // number of 4byte words in above struct //DEFAULT Configuration for get_sample() is for all fields // index into sys_data.data_cfg[] #define CFG_SAMPLE_NUM 0 #define CFG_TIMEDATE 1 // + MM/DD/YYYY HH:MM:SS #define CFG_V_THERMISTOR 2 //+ Vthermistor\t #define CFG_V_THERMISTOR_STD 3 //+ Vthermistor_std\t #define CFG_CALC_TEMP 4 //+ calculated_temperature_Vthermistor\t #define CFG_VRSI 5 //+ Vint\t #define CFG_VRSI_STD 6 //+ Vint_std\t #define CFG_CALC_PH_VRSI 7 //+ estimated_pH_int\r\n #define CFG_VRSE 8 //+ Vext #define CFG_VRSE_STD 9 // + Vext_std #define CFG_CALC_PH_VRSE 10 //+ estimated_pH_ext\r\n (new 6May2019 TM) #define CFG_VRSI_BIASED 11 //+ Vint_offset\t #define CFG_VRSI_BIASED_STD 12 //+ Vint_offset_std\t #define CFG_VRSE_BIASED 13 //+ Vext_offset\t #define CFG_VRSE_BIASED_STD 14 //+ Vext_offset_std\t #define CFG_V_COUNTER_ELECT 15 //+ Vcounter_electrode #define CFG_V_COUNTER_ELECT_STD 16 //+ Vcounter_electrode_std #define CFG_I_COUNTER 17 // + Counter_current #define CFG_I_SUBSTRATE 18 //+ Substrate_current #define CFG_VIN_BAT_VOLT 19 //+ Battery_Volt #define CFG_BIAS_BAT_POS 20 //+ Bias Bat Volt #define CFG_BIAS_BAT_NEG 21 #define CFG_BRD_TEMP 22 //+ Board_Temperature\t #define CFG_BRD_HUMIDITY 23 // + Humidity_sensor #define CFG_OPTODE 24 // Aanderaa optode #define CFG_CTD 25 // Aanderaa or MicroCat conductivity, AKA CFG_CONDUCTIVITY new 25 Mar 2021 #define CFG_SPARE1 26 #define CFG_SPARE2 27 #define CFG_SPARE3 28 #define CFG_SPARE4 29 #define CFG_SPARE5 30 #define CFG_SPARE6 31 // MAX_NUMOF_CONFIG_FIELDS is set to 32 above. //sys_data.app_cfg // App config, used for bringing out new features, etc #define APPCFG_SAMPLING_DIAG 0 // switch on timing printfs in fast_sample #define APPCFG_TEMPC_SH_ALG 1 // used in Durafet_temp to switch algorithm #define APPCFG_MICROSD_ENABLE 2 // APPCFG_SAMP_FLEX 2 // In fast_sample, used to allow for user edit variables for Trials and sps per ADS1284 sample #define APPCFG_MENU_LEVEL 3 #define APPCFG_DEPLOY_UARTECHO 4 //Turn off uartEcho in deployment to help m2m with labview //#define APPCFG_SPARE4 4 #define APPCFG_SPARE5 5 #define APPCFG_SPARE6 6 #define APPCFG_SPARE7 7 //----------- Key Defs -------- #define CTRL_X 24 //#define CTRL-X CTRL_X // Global variables extern struct systemData sys_data; extern struct systemDataVolatile sys_data_vol; extern struct systemDataVolatile sys_data_chg; void read_bias_bat(void); void display_battery_boardSensors(void); void display_ph_ref_therm_volts(void); void display_calcd_pH_intRef_therm(void); void display_calcd_pH_extRef_therm_sal(float Salinity); void communicate_with_instruments(void); int power_output_tests(void); void test_24bit_adc_mux(void); int board_qa_and_init(int initFlg); void initSysDataVolatileVariables(void); void SysTickHandler(void); unsigned long Timer_10ms(bool reset); unsigned long Timer_1ms(bool reset); void ms_delay(unsigned int msec); void delay_msec(unsigned int msec); struct tm *get_RTC_time(void); uint32_t storeSysDataVariables(void); //EEPROM void retrieveSysDataVariables(); uint32_t smartStoreSysData(void); void storeSysSampFRAMVariables(void); void retrieveSysSampFRAMVariables(void); void initSysSampFRAMVariables(void); int isNameInSavedDataString(char* name); void saveSysDataVariableName(); float batt_volt(); float batt_volt_iso(); float controller_temp(); float pressure(void); //int writeDeploymentInformationHeader(const time_t currentTime); //deprecated 21 Apr 2021 void sendlast_takesample(void); //void fast_sample(int txFlg); // moved to sampling.c void error_store(const char *error_buff); float DuraFET_temp(float V_therm, float TCOffset); float calc_pHext(float Eext, float TC, float salt); float calc_pHint(float Eint, float TC); void ph_calib(void); float read_env_sensors(void); #endif /* MPHOX_SYSTEM_H_ */