/* * David Muller; Germán Alfaro * davehmuller@gmail.com; alfaro.germanevera@gmail.com * * Thom Maughan; tm@mbari.org 2018... */ #ifndef PHFETSOS_SYSTEM_H_ #define PHFETSOS_SYSTEM_H_ #include #include #include #include #include #include #include #include #include #if BOARD_MFET >= 1 || BOARD_MPHOX == 1 || BOARD_MSC == 2 #include "inc/tm4c123gh6pge.h" #endif #if BOARD_NANOFET == 1 || BOARD_MSC == 3 #include "inc/tm4c123gh6pm.h" #endif #include "inc/hw_memmap.h" #include "inc/hw_types.h" #include "inc/hw_hibernate.h" #include "driverlib/debug.h" #include "driverlib/fpu.h" #include "driverlib/gpio.h" #include "driverlib/pin_map.h" #include "driverlib/rom.h" #include "driverlib/rom_map.h" #include "driverlib/sysctl.h" #include "driverlib/uart.h" #include "driverlib/eeprom.h" #include "driverlib/gpio.h" #include "driverlib/hibernate.h" #include "driverlib/ssi.h" #include "driverlib/interrupt.h" //V=I*R => V=I*15K => I=V/15K amps => I=V*10^9/15K nano-Amps => I=V*66.6k nA => 15uV/nA. #define COUNTERELECTRODE_IK_SCALE 66666.667 // 10^9/15K MCAP has 15K resistor, Ik // #define SUBSTRATECURRENT_IB_SCALING 1000 // 10^9/1M = 1000 MCAP has 1M resistor for Ib, substrate current #define SIZEOF_PRNBUF 1020 #if BOARD_MFET == 1 #define VERSION "v3.7.1 was the last support for MFET v1" // MFET software version Glider is 9600 baud // battery backed HIB, no FRAM // only one can be set to 1. HIB uses battery backed ram in hibernate module, EEPROM uses onchip EEPROM with 500K cycles, FRAM requires 24CL04B chip on MFET v2 #define NONVOLATILEMEM "Nonvol mem: Hibernate module battery backed RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 1 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 0 #endif #if BOARD_MFET == 2 #define VERSION "v5.0.0 MFET revC" // MFET software version Glider is 9600 baud // FRAM (and battery backed HIB) #define NONVOLATILEMEM "Nonvol mem: i2c Ferroelectric RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 0 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 2 // was 1, 2 means use of sys_samp #endif #if BOARD_MPHOX == 1 || BOARD_MSC == 2 #define VERSION "v5.0.0 MpHOx revA/B" // MFET software version Glider is 9600 baud // FRAM (and battery backed HIB) #define NONVOLATILEMEM "Nonvol mem: i2c Ferroelectric RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 0 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 2 // was 1 (sys_samp) #endif #if BOARD_NANOFET == 1 #define VERSION "v5.0.0 NanoFET revB" // NanoFET software version, hardware version (revA and revB and compatible) // FRAM (and battery backed HIB) #define NONVOLATILEMEM "Nonvol mem: i2c Ferroelectric RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 0 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 2 #endif #if BOARD_MSC == 3 #define VERSION "v5.0.0 MSC3 revA" // MSC3 Tiva software version, hardware version // FRAM (and battery backed HIB) #define NONVOLATILEMEM "Nonvol mem: i2c Ferroelectric RAM" #define EEPROM_REG_STORE 0 // old, wear out EEPROM #define HIB_REG_STORE 0 // used to turn on HIB register store to prevent EEPROM wearout #define FRAM_REG_STORE 2 #endif #ifndef VERSION #define VERSION "COMPILER FLAGS BOARD_MFET or BOARD_MPHOX or BOARD NANOFET NOT DEFINED" #endif #define NOMINAL_SAMPLE_TIMES 1 #define FAST_SAMPLE_TIMES 0 /* Boolean type */ typedef enum { FALSE = 0, TRUE } BOOL; //typedef enum {IDLE, START, DEPLOYED, COMMAND} deploy_state; typedef enum {IDLE, DEPLOYED} deploy_state; //DEPLOYED is WAKERTC, IDLE is WAKEGPIO typedef enum {NORMAL=1, VERBOSE} output_mode; #define GPIOWAKEUP 0 #define RTCWAKEUP 1 /* * Delay lengths for SysCtlDelay(). */ #define CLOCKSPEED 50000000.0 //clock is set to run at 50MHZ #define ONESEC (int)ceil((CLOCKSPEED/3.0)) //SysCtlDelay takes 3 cycles per loop...so delay = DesiredDelayTimeInSeconds/((1/CLOCKSPEED)*3) #define MILLISECOND (int)ceil((.001 / ((1.0/CLOCKSPEED)*3.0))) #define MICROSECOND (int)ceil((.000001 / ((1.0/CLOCKSPEED)*3.0))) /* * Buffer lengths. Thom TODO: consolidate the buffers to one for each uart rather than for each driver. */ #define TIMESTAMPLENGTH 50 #define INSTRUMENTBUFFSIZE 400 #define MICROCAT_BUFFER_SIZE 128 #define DBG_UART_BUFFER_SIZE 128 // buffer defined in microcat.h microcat sbe37 is on uart4 //#define OPTODE_BUFFER_SIZE 128 // buffer defined in optode.h optode is on uart3 //#define CTD_BUFFER_SIZE 128 #define AUX1_BUFFER_SIZE 128 #define AUX2_BUFFER_SIZE 128 //#define OCR_BUFFER_SIZE 128 // UART3 //#define NANOFET_BUFFER_SIZE 256 //128 // UART3 #define GDATA_BYTES 512 // Number of bytes to read out with gdata command #define IS_PRESENT 1 #define NOT_PRESENT 0 /* * Constants */ #define R_ 8.31451 // Univ gas constant #define F_ 96487 // Faraday constant #define dEoINT_dt -0.0011012 // Temperature coefficient for internal reference [Volts/C] #define dEoEXT_dt -0.0010482 // Temeprature coefficient for external reference [Volts/C] #define LN10 2.302585 // Natural log of 10 // Standard deviation array values #define SD_AVG 5 #define SD_MEAN SD_AVG #define SD_DIFF_SQ SD_AVG+1 #define SD_VALUES 5 // AD1248 24-bit A/D defines // signed 24bit numeric range is: -8,388608 to +8,388607 #define TWOTOTHE23 8388608 // 2 to the 23rd = 8388608 #define COUNTSTOVOLTS (float) (2.048 / (TWOTOTHE23 - 1)) //each count returned from the ADC has a weight of (Vref/PGA)/(2^23 -1 ). We use PGA = 1. #define PGA_1 0x00 #define PGA_2 0x10 #define PGA_4 0x20 #define PGA_8 0x30 #define PGA_16 0x40 #define PGA_32 0x50 #define PGA_64 0x60 #define PGA_128 0x70 #define SPS_5 0x00 #define SPS_10 0x01 #define SPS_20 0x02 #define SPS_40 0x03 #define SPS_80 0x04 #define SPS_160 0x05 #define SPS_320 0x06 #define SPS_640 0x07 #define SPS_1000 0x08 #define SPS_2000 0x09 #define VTHERM_TRIALS 5 #define VTHERM_SPS 20 #define VRSI_TRIALS 10 #define VRSI_SPS 20 #define VRSE_TRIALS 10 #define VRSE_SPS 20 #define IK_TRIALS 1 #define IK_SPS 20 #define VK_TRIALS 5 #define VK_SPS 20 #define IB_TRIALS 1 #define IB_SPS 20 #define VB_TRIALS 5 #define VB_SPS 20 #define VBIAS_TRIALS 1 #define VBIAS_SPS 40 #define MAX_SAMPLING_PERIOD 3600 // New 15 Aug 2022, implementing a fix in sleep.c for a corrupt wakeup time. #define MIN_SAMPLING_PERIOD 2 /* * Definition of a structure containing the controller's parameters * These parameters are all modifiable by external user except where noted. * Structure is stored in EEPROM during hibernation. */ #define MAX_NUMOF_CONFIG_FIELDS 32 //was 30 These are for sampling / data logging configuration A-Z, 0-9 #define MAX_NUMOF_APP_CONFIG_FIELDS 16 // was 8 in 4.0.7 #define MAX_NUMOF_K2_CAL_FIELDS 4 // Storage allocated in sys_data #define NUMOF_K2_CAL_FIELDS 4 // present size of polynomial #define MAX_NUMOF_FP_CAL_FIELDS 7 // Worse case storage allocation based on Josh Plant discussion #define NUMOF_FP_CAL_FIELDS 7 // present size of polynomial #define MAX_FILENAME 16 // 8.3 filename plus padding 24 //80 is too much, should be 32 or 40 at most. #define MAX_USER_INITIALS 8 #define MAX_TESTER_NAME 48 #define MAX_VERSION_SIZE 32 #define MAX_BOARD_SN 24 //30 #define MAX_PT_CAL_DATE 12 #define MAX_K0_CAL_DATE 12 #define MAX_SERVICE_DATE 12 #define MAX_CAL_FILENAME 32 //16 #define MAX_MCAP_SN 24 //30 #define MAX_PACKAGE_NAME 32 //30 #define MAX_SENSOR_SN 8 //24 //30 new 7 Sep 2023 changed from 24 to 8 and added 2 more 8 char fields, was MAX_DURAFET_SN #define MAX_ISFET_SN 8 // MAX_CAPADAP_SN 24 //30 #define MAX_ISE_SN 8 //24 //30 #define MAX_OPTODE_SN 24 //30 #define MAX_CTD_SN 24 //30 #define MAX_PUMP_SN 24 //30 #define MAX_BOARD_FABNOTE 80 // was 80, now part of qa #define MAX_PACKAGE_FABNOTE 80 // #define MAX_DEPLOY_NOTE 80 // pump_sequencing types for selecting sequencing statemachine #define TYPE_PUMP_NOTDEFD 0 #define TYPE_PUMP_SINGLE 1 #define TYPE_2PUMP_BEAMSV1 2 #define TYPE_2PUMP_BEAMSV2 3 #define TYPE_PUMP_SELFCAL 4 struct qaData { uint32_t microSD; // microSD uint32_t time; // time of QA uint32_t test_time; // time it took to run QA uint32_t eeprom; // size of sys_data in eeprom, 0 if there is a problem uint32_t sys_data_init; // was the data initialized uint32_t fram; uint32_t adc12onchip; uint32_t adc24; // how many of the ADC fields are out of expected Jensenian range float Vrsi; float Vrsi_std; float Vrsi_err; float Vrse; float Vrse_std; float Vrse_err; float Vtherm; float Vtherm_std; float Vtherm_err; float Ik; float Ik_std; float Ik_err; float Vk; float Vk_std; float Vk_err; float Ib; float Ib_std; float Ib_err; float Vb; float Vb_std; float Vb_err; float Vbias_pos; float Vbias_neg; uint32_t aux_pwr1; uint32_t aux_pwr2; uint32_t aux_pwr3; uint32_t ctd; uint32_t optode; uint32_t comm_pwr; char tester[MAX_TESTER_NAME]; char firmware_version[MAX_VERSION_SIZE]; char board_fab_note[MAX_BOARD_FABNOTE]; // New board fabrication notes, dates, etc. }; struct sampData { unsigned int sampNum; // 1 unsigned int timestamp; // 2 float fBiasNeg; // 3 float fBiasPos; // 4 float fIb; // 5 (Ib) SubstrateCurrent float fIk; // 6 (Ik) CounterElectrodeCurrent float fIk_std; // 7 float fVk; // 8 (Vk) CounterElectrodeVoltage float fVk_std; // 9 float fVtherm; // 10 float fVtherm_std; // 11 Likely not needed float fTempC; // 12 float fVrsi; // 13 float fVrsi_std; // 14 float pHint; // 15 float fVrse; // 16 float fVrse_std; // 17 float pHext; // 18 float fVbat_main; // 19 float fBrdTempC; // 20 unsigned int uiHumidity; // 21 float spare1; // 22 float spare2; // 23 float spare3; // 24 }; // systemData struct organized for 4 byte packing, also fixed buffer overruns by setting size of fields in define struct systemData { //---------------- samplingData --------------------------- uint32_t sampling_period; //8 pH sampling period uint32_t chksum; // was sample_average DEPRECATED (was int32_t) 12 Number of pH sensor samples to average uint32_t averaging_interval; //16 Number of seconds between each average float low_batt_volt; //4 Low battery voltage threshold float TCOffset; //24 DuraFET temperature calibration variable (not needed) float TCSlope; float k0ext; //28 was float Eo_ext_25C;, renamed k0ext 2 Apr 2021 float k0int; //32 was float Eo_int_25C;, renamed k0int 2 Apr 2021 float k2ext; //28 added 25 Apr 2021 float k2int; //32 added 25 Apr 2021 double quadTherm_c0; // 4 coefficient c0 for thermistor double quadTherm_c1; // 4 coefficient c1 for thermistor double quadTherm_c2; // 4 coefficient c2 for thermistor double quadTherm_c3; // 4 coefficient c3 for thermistor double shTherm_A; // steinhart-hart coefficient A double shTherm_B; // steinhart-hart coefficient C double shTherm_C; // steinhart-hart coefficient B float default_sal; //36 default salinity (FRAM) TODO //float spareVar; // was sensor_sal //float sensor_sal; // salinity read from conductivity (SBE, Aanderaa) FRAM uint32_t Vrsi_sps; //Vrsi_sps //418 pH Vint data rate setting (sps) uint32_t Vrsi_trials; //Vrsi_trials uint32_t Vrse_sps; uint32_t Vrse_trials; uint32_t Vtherm_sps; uint32_t Vtherm_trials; uint32_t Ik_sps; uint32_t Ik_trials; uint32_t Vk_sps; uint32_t Vk_trials; uint32_t Ib_sps; uint32_t Ib_trials; uint32_t Vb_sps; uint32_t Vb_trials; uint32_t Vbias_sps; uint32_t Vbias_trials; uint32_t offset_Ik; // 800uV or so, tbd measure a QA step. uint32_t offset_Ib; output_mode output; //422 Verbose mode during deployment if true (enum is 4 bytes?) uint32_t test_mode; //426 Indicates test deployment uint32_t fast_mode; // Future: changed to sampling mode (fast, precise, etc.) uint32_t solenoid_on2hold_msec; uint32_t solenoid_hold_pwm; uint32_t solenoid_holdtime; // new 20 Jul 2021 uint32_t baud_rate; //470 baud rate (added by tm Jul 2018) unsigned char data_cfg[MAX_NUMOF_CONFIG_FIELDS]; //data field / logging configuration (added by tm Jul 2018) unsigned char app_cfg[MAX_NUMOF_APP_CONFIG_FIELDS]; bool GMT; //456 GMT or Local time bool sample_aligned; //460 Sample aligned to hour uint32_t diag; // diagnostic flag, for developer uint32_t debug_flag; // turn on diagnostic debug printf's // Sampling and Sequencing StateMachine variables uint32_t deploy_time; // timestamp of when 'deploy' menu action. deployment time (Todo, put in FRAM?) (variable location changed from above diag). uint32_t start_pump_time; // (seconds) Wakeup on sampling interval, but check the 'start deployment time' before actual pumping/sampling 16 Feb 2022 uint32_t pump_seq_type; // 0) legacy single pump, 1) BEAMS v1 dual pump seq, 2) BEAMS v2 uint32_t sampleCnt_duty_on; // duty cycle for extending experiment. 3 days on, 5 days off. Number of 'sample periods' on uint32_t sampleCnt_duty_off; // in sample periods. Accept input in hours, translate to sample periods (keep implementation simple for now). uint32_t pump1_cycles; // = 10 cycles uint32_t pump2_cycles; // = 5 cycles uint32_t pump1_ontime; //20 Active pump time; // = 30 cycles uint32_t pump2_ontime; // = 10 cycles uint32_t pump_spare[16]; // make room for other variables (future pump sequencer) pump3, etc. // was float spare[9]; float pHOffset; // new 3 Aug 2021 (speculative placeholders, can be used as spare) k0, etc are used for offsets on ph float pHSlope; //float TCSlope; float sensor_ctd_TC; float sensor_optode_TC; float K2_Cal[MAX_NUMOF_K2_CAL_FIELDS]; // worse case 4th order polynomial float fP_Cal[MAX_NUMOF_FP_CAL_FIELDS]; // worse case 7th order polynomial float k0_HCL; float k0_SW; float k0std_SW; float spare[25]; // was spare[56] until 6 K2 and 12 F(p) cal coeeff (56-6-12=38), was float spare[64]; reduced by 32bytes (8 float) 10 Oct 2022 // LAYOUT CHANGE 16 Feb 2022, now 64 for v4.x future expansion. was 4 (was 9) 4 byte spares (36 bytes) for future expansion without causing EEPROM struct issues char service_date[MAX_SERVICE_DATE]; //12 char PT_Cal_date[MAX_PT_CAL_DATE]; //12 char k0_Cal_date[MAX_K0_CAL_DATE]; //12 char cal_filename[MAX_CAL_FILENAME]; //32, was 16 char firmware_version[MAX_VERSION_SIZE]; //32 //------------------ System MetaData ------------------ // re-arranged struct to put char fields after numeric char fileName[MAX_FILENAME]; //116 The name the user would like to give their data output file, fatfs max is 8.3 char user[MAX_USER_INITIALS]; //452 User initials char board_SN[MAX_BOARD_SN]; //146 (added 3Apr2021) board (MFET, MpHOx, nanoFET) serial number char mcap_SN[MAX_MCAP_SN]; //176 (added 3Apr2021) mcap serial number char sensor_SN[MAX_SENSOR_SN]; //226 was 24, now 8, was durafet_SN, now sensor_SN, 7 Sep 2023 DuraFET sensor serial number char isfet_SN[MAX_ISFET_SN]; // new 7 Sep 2023 char ise_SN[MAX_ISE_SN]; // new 7 Sep 2023 char package_name[MAX_PACKAGE_NAME]; //196 Name of integrated package (underway system, etc.) (was 20, now 30, bug in buff entry size) char optode_SN[MAX_OPTODE_SN]; //346 (added 3Apr2021) Aanderaa optode serial number char ctd_SN[MAX_CTD_SN]; //376 (added 3Apr2021) Aanderaa conductivity or MicroCat aka ctd serial number char pump_SN[MAX_PUMP_SN]; //406 Pump serial number char pump2_SN[MAX_PUMP_SN]; //406 Pump serial number char pump3_SN[MAX_PUMP_SN]; //406 Pump serial number char package_fab_note[MAX_BOARD_FABNOTE]; // (added 4Apr2021) was board fabrication notes, now 7 Nov 2023 package fab notes char deploy_note[MAX_DEPLOY_NOTE]; // (Todo FRAM) struct qaData qa; }; //Note: i2c_fram.c has fram layout (64bytes allocated for the 15*4=60 byte struct) struct systemSamplingData //TODO: rename to systemVolatileData { int32_t state; //430 IDLE, DEPLOYED, COMMAND, NOT USER MODIFIABLE <<<<<------ uint32_t nextWakeUp; //434 Next intended RTC match (wake-up time) NOT USER MODIFIABLE <<<<<------ uint32_t next_gdata_fptr; //438 The file position of the next gdata sample. NOT USER MODIFIABLE <<<<<------ uint32_t current_sample; //442 The current data record to be stored. NOT USER MODIFIABLE <<<<<------ float AD24_std; //464 standard deviation for AD24 <<<<-------- float sensor_sal; // salinity read from conductivity (SBE, Aanderaa) float spare1; float spare2; float spare3; float spare4; uint32_t initNum; uint32_t pump_seq_state; // for controlling/sequencing pump/solenoid uint32_t pump1_cnt; uint32_t pump2_cnt; uint32_t start_pump_cntdown; // count down in 'sample periods' }; // DEPRECATED variables that change each sample (will wear out onchip 500k write cycle flash / eeprom), stored in FRAM struct systemDataVolatile { uint32_t state; // IDLE, DEPLOYED, COMMAND, NOT USER MODIFIABLE uint32_t nextWakeUp; // Next intended RTC match (wake-up time) NOT USER MODIFIABLE uint32_t next_gdata_fptr; // The file position of the next gdata sample. NOT USER MODIFIABLE Note: was unsigned long uint32_t current_sample; // The current data record to be stored. NOT USER MODIFIABLE float AD24_std; uint32_t samp_state; uint32_t chksum; }; #define SYSDATACHG_NUMWORDS 7 // number of 4byte words in above struct //#endif //DEFAULT Configuration for get_sample() is for all fields // index into sys_data.data_cfg[] #define CFG_SAMPLE_NUM 0 #define CFG_TIMESTAMP 1 // + MM/DD/YYYY HH:MM:SS #define CFG_V_THERMISTOR 2 //+ Vthermistor\t #define CFG_V_THERMISTOR_STD 3 //+ Vthermistor_std\t #define CFG_CALC_TEMP 4 //+ calculated_temperature_Vthermistor\t #define CFG_VRSI 5 //+ Vint\t #define CFG_VRSI_STD 6 //+ Vint_std\t #define CFG_CALC_PH_VRSI 7 //+ estimated_pH_int\r\n #define CFG_VRSE 8 //+ Vext #define CFG_VRSE_STD 9 // + Vext_std #define CFG_CALC_PH_VRSE 10 //+ estimated_pH_ext\r\n (new 6May2019 TM) #define CFG_VRSI_BIASED 11 //+ Vint_offset\t #define CFG_VRSI_BIASED_STD 12 //+ Vint_offset_std\t #define CFG_VRSE_BIASED 13 //+ Vext_offset\t #define CFG_VRSE_BIASED_STD 14 //+ Vext_offset_std\t #define CFG_V_COUNTER_ELECT 15 //+ Vcounter_electrode #define CFG_V_COUNTER_ELECT_STD 16 //+ Vcounter_electrode_std #define CFG_I_COUNTER 17 // + Counter_current #define CFG_I_SUBSTRATE 18 //+ Substrate_current #define CFG_VIN_BAT_VOLT 19 //+ Battery_Volt #define CFG_BIAS_BAT_POS 20 //+ Bias Bat Volt #define CFG_BIAS_BAT_NEG 21 #define CFG_BRD_TEMP 22 //+ Board_Temperature\t #define CFG_BRD_HUMIDITY 23 // + Humidity_sensor #define CFG_UART3_INST 24 // UART3 Instrument, was #define CFG_OPTODE 24 // Aanderaa optode #define CFG_UART4_INST 25 // Aanderaa or MicroCat conductivity, AKA CFG_CONDUCTIVITY new 25 Mar 2021, was CFG_CTD #define CFG_SPARE1 26 // was spare1 CFG_OCR #define CFG_SPARE2 27 #define CFG_SPARE3 28 #define CFG_SPARE4 29 #define CFG_SPARE5 30 #define CFG_SPARE6 31 // Instrument drivers for UART3/Optode port and UART4/CTD port (sequential numbering, renumber is OK to do) #define INST_OPTODE_NOTDEFD 0 // Instrument driver types for Uart3 / Optode port #define INST_OPTODE 1 #define INST_OCR504 2 #define INST_NANOFET 3 #define INST_PICOPH 4 #define INST_CTD_NOTDEFD 5 // Instrument driver types for Uart4 / CTD port #define INST_SBE37_MICROCAT 6 #define INST_AANDERAA_5860 7 #define INST_ADV 8 // MAX_NUMOF_CONFIG_FIELDS is set to 32 above. //sys_data.app_cfg // App config, used for bringing out new features, etc #define APPCFG_SAMPLING_DIAG 0 // switch on timing printfs in fast_sample #define APPCFG_TEMPC_SH_ALG 1 // used in Durafet_temp to switch algorithm #define APPCFG_MICROSD_ENABLE 2 // APPCFG_SAMP_FLEX 2 // In fast_sample, used to allow for user edit variables for Trials and sps per ADS1284 sample #define APPCFG_MENU_LEVEL 3 #define APPCFG_DEPLOY_UARTECHO 4 //Turn off uartEcho in deployment to help m2m with labview //#define APPCFG_SPARE4 4 #define APPCFG_EXEC_SWITCHERONI 5 // Was APPCFG_SPARE5 #define APPCFG_SPARE6 6 #define APPCFG_SPARE7 7 #define APPCFG_SPARE8 8 #define APPCFG_SPARE9 9 #define APPCFG_SPARE10 10 #define APPCFG_SPARE11 11 #define APPCFG_SPARE12 12 #define APPCFG_SPARE13 13 #define APPCFG_SPARE14 14 #define APPCFG_SPARE15 15 // Defines for exec / sampling function called in main #define EXEC_DEPLOY 0 #define EXEC_EDDY_COVARIANCE 1 #define EXEC_FASTSAMP 2 // Defaults and limits #define EXEC_MAXDEFD EXEC_FASTSAMP #define EXEC_DEFAULT EXEC_DEPLOY //----------- Key Defs -------- #define CTRL_X 24 //#define CTRL-X CTRL_X // Global variables extern struct systemData sys_data; extern struct systemDataVolatile sys_data_vol; extern struct systemDataVolatile sys_data_chg; void read_bias_bat(void); void display_battery_boardSensors(void); void display_ph_ref_therm_volts(void); void display_calcd_pH_intRef_therm(void); void display_calcd_pH_extRef_therm_sal(float Salinity); void communicate_with_instruments(void); int power_output_tests(void); void test_24bit_adc_mux(void); int board_qa_and_init(int initFlg); void initSysDataVolatileVariables(void); void SysTickHandler(void); unsigned long Timer_10ms(bool reset); unsigned long Timer_1ms(bool reset); void ms_delay(unsigned int msec); void delay_sec(unsigned int secs); void delay_msec(unsigned int msec); void delay_usec(unsigned int usec); struct tm *get_RTC_time(void); uint32_t storeSysDataVariables(void); //EEPROM void retrieveSysDataVariables(void); uint32_t storeSysSampFRAMVariables(void); //was void storeSysSampFRAMVariables(void); //FRAM void retrieveSysSampFRAMVariables(void); int verifySysDataVariables(void); uint32_t smartStoreSysData(void); void initSysSampFRAMVariables(void); int isNameInSavedDataString(char* name); void saveSysDataVariableName(); float batt_volt(); float batt_volt_iso(); float controller_temp(); float pressure(void); //int writeDeploymentInformationHeader(const time_t currentTime); //deprecated 21 Apr 2021 void sendlast_takesample(void); //void fast_sample(int txFlg); // moved to sampling.c void error_store(const char *error_buff); float DuraFET_temp(float V_therm, float TCOffset); float calc_pHext(float Eext, float TC, float salt); float calc_pHint(float Eint, float TC); void ph_calib(void); float read_env_sensors(void); #endif /* PHFETSOS_SYSTEM_H_ */