HR: 1340h
AN: V43B-1579    [Abstracts]
TI: Rapid Determination of Mineral Abundance by X-ray Microfluorescence Mapping and Multispectral Image Analysis
AU: * Moscati, R J
EM: rmoscati@usgs.gov
AF: US Geological Survey, Box 25046 MS 963 Denver Federal Center, Denver, CO 80225 United States
AU: Marshall, B D
EM: bdmarsha@usgs.gov
AF: US Geological Survey, Box 25046 MS 963 Denver Federal Center, Denver, CO 80225 United States
AB: X-ray microfluorescence (XRMF) spectrometry is a rapid, accurate technique to map element abundances of rock surfaces (such as thin-section billets, the block remaining when a thin section is prepared). Scanning a specimen with a collimated primary X-ray beam (100 μm diameter) generates characteristic secondary X-rays that yield the relative chemical abundances for the major rock-/mineral-forming analytes (such as Si, Al, K, Ca, and Fe). When Cu-rich epoxy is used to impregnate billets, XRMF also can determine porosity from the Cu abundance. Common billet scan size is 30 x 15 mm and the typical mapping time rarely exceeds 2.5 hrs (much faster than traditional point-counting). No polishing or coating is required for the billets, although removing coarse striations or gross irregularities on billet surfaces should improve the spatial accuracy of the maps. Background counts, spectral artifacts, and diffraction peaks typically are inconsequential for maps of major elements. An operational check is performed after every 10 analyses on a standard that contains precisely measured areas of Mn and Mo. Reproducibility of the calculated area ratio of Mn:Mo is consistently within 5% of the known value. For each billet, the single element maps (TIFF files) generated by XRMF are imported into MultiSpec© (a program developed at Purdue University for analysis of multispectral image data, available from http://dynamo.ecn.purdue.edu/~biehl/MultiSpec/) where mineral phases can be spectrally identified and their relative abundances quantified. The element maps for each billet are layered to produce a multi-element file for mineral classification and statistical processing, including modal estimates of mineral abundance. Although mineral identification is possible even if the mineralogy is unknown, prior petrographic examination of the corresponding thin section yields more accurate maps because the software can be set to identify all similar pixels. Caution is needed when using MultiSpec© to distinguish mineral phases with similar chemistry (for example, opal and quartz) and minerals that occupy very small surface areas (<10 pixels). In either case, careful petrography and informed use of the software will allow rapid use of MultiSpec© to create accurate mineral maps of rock and thin-section billet surfaces. This technique, for example, has allowed quantitative estimates of calcite and silica abundances to be determined on about 200 samples of secondary mineral coatings from the unsaturated zone at Yucca Mountain, Nevada.
DE: 1094 Instruments and techniques
DE: 3625 Petrography, microstructures, and textures
DE: 3694 Instruments and techniques
SC: Volcanology, Geochemistry, Petrology [V]
MN: Fall Meeting 2005