HR: 1340h
AN: S53B-0217 [Abstracts]
TI: How Thick is the Earth's Crust?
AU: * Mooney, W D
EM: mooney@usgs.gov
AF: US Geological Survey, 345 Middlefield Rd. MS 977, Menlo Park, CA 94025
United States
AU: Chulick, G S
EM: chulickg@uww.edu
AF: University of Wisconsin, 800 West Main St., Whitewater, WI 53190
United States
AU: Detweiler, S T
EM: shane@usgs.gov
AF: US Geological Survey, 345 Middlefield Rd. MS 977, Menlo Park, CA 94025
United States
AB:
In order to understand continental evolution and other geological processes, it is first necessary to develop a thorough
knowledge of the Earth's crustal structure. We present a recently-updated contour map of the thickness of the Earth's crust
using a 10-km contour interval, with the 45-km contour also included. This contour map was created from about 8000
individual crustal data points that have been acquired during the past 65 years. The contour map honors all available
seismic refraction measurements for features with a dimension greater than 2 degrees. Crustal thicknesses in Eurasia, North
America, and Australia are well constrained by seismic refraction data, while new data has enhanced resolution in Antarctica,
South America, Africa, and Greenland. To a first approximation, the continents and their margins are outlined by the 30-km
contour. The part of the continental interior enclosed by the 40-km contour and regions with crustal thickness of 45 to 50
km are found on all well-surveyed continents. Continental crust with thickness in excess of 50 km is exceedingly rare and
accounts for less than 10% of surveyed continental crust. These observations, now available on a global basis, provide
important information to be used for numerous scientific studies, including ongoing refinements to global crustal models.
UR: http://quake.wr.usgs.gov/research/structure/CrustalStructure
DE: 7260 Theory and modeling
DE: 8124 Earth's interior--composition and state (old 8105)
DE: 7205 Continental crust (1242)
DE: 7218 Lithosphere and upper mantle
SC: Seismology [S]
MN: 2004 AGU Fall Meeting