David H. Kil, Frances B. Shin; Time-adaptive pattern recognition and prediction for situational robustness, Proceedings of MTS/IEEE OCEANS'97 Conference, pp. 773 - 778, September 1997.
David H. Kil, Frances B. Shin; Feature-based multisensor fusion and performance quantification using sufficient statistics, Proceedings of MTS/IEEE OCEANS'96 Conference, pp. 925 - 928, September 1996.
Frances B. Shin, David H. Kil, Gerald J. Dobeck; The impact of lossy image compression on automatic target recognition performance, Proceedings of MTS/IEEE OCEANS'96 Conference, pp. 943 - 948, September 1996.
Frances B. Shin, David H. Kil; Robust mine detection and classification with target physics-derived features and classifiers, Proceedings of MTS/IEEE OCEANS'96 Conference, pp. 1204 - 1207, September 1996.
David H. Kil, Frances Bongjoo Shin; LFA target characterization with hybrid classifiers, Proceedings of MTS/IEEE OCEANS'95 Conference, pp. 380 - 386, September 1995.
Frances B. Shin, David H. Kil; Full spectrum signal processing, Proceedings of MTS/IEEE OCEANS'95 Conference, pp. 397 - 403, September 1995.
David H. Kil, Frances Bongjoo Shin; Reduced dimension image compression for remotely distributed underwater signal processing, Proceedings of MTS/IEEE OCEANS'95 Conference, pp. 1183 - 1188, September 1995.
Frances B. Shin (M'96) received the B.S. and M.S. degrees in electrical engineering from the University of Illinois at Urbana in 1985, and the Polytechnic University of New York, Brooklyn, in 1988. She is currently pursuing the M.B.A. degree in technology forecasting and management at Arizona State University, Tempe.
She is with the Advanced Concepts and Development group of Lockheed Martin--AZ, Litchfield Park. Her research interests encompass pattern recognition, adaptive signal processing, financial market analysis, and statistics. She has published over 18 papers in the areas of pattern recognition, image compression, chaos, and financial market prediction. With D. Kil, she coauthored Pattern Recognition and Prediction with Applications to Signal Characterization (American Institute of Physics (AIP) Press).
Ms. Shin is a member of Eta Kappa Nu.