Kenneth D. Hill

Kenneth D. Hill, Thomas M. Dauphinee, Donald J. Woods; The uniqueness of the Practical Salinity Scale (1978): Testing the scale with natural seawaters, IEEE J. Oceanic Eng., vol. 14, pp. 265 - 267, July 1989.

Kenneth D. Hill, Donald J. Woods; The Dynamic Response of the Two-Electrode Conductivity Cell, IEEE J. Oceanic Eng., vol. 13, pp. 118 - 123, July 1988.

Kenneth D. Hill, Thomas M. Dauphinee, Donald J. Woods; The Uniqueness of the Practical Salinity Scale (1978): Testing the Scale with Natural Seawaters, Proceedings of MTS/IEEE OCEANS'87 Conference, pp. 213 - 215, September 1987.

Kenneth D. Hill, Donald J. Woods; The Dynamic Response of the Two-Electrode Conductivity Cell, Proceedings of MTS/IEEE OCEANS'87 Conference, pp. 297 - 302, September 1987.

Kenneth D. Hill, Thomas M. Dauphinee, Donald J. Woods; A comparison of the temperature coefficients of electrical conductivity of Atlantic and Pacific seawaters, IEEE J. Oceanic Eng., vol. 11, pp. 485 - 486, October 1986.

Kenneth D. Hill, Thomas M. Dauphinee, Donald J. Woods; The extension of the Practical Salinity Scale 1978 to low salinities, IEEE J. Oceanic Eng., vol. 11, pp. 109 - 112, January 1986.


Kenneth D. Hill was born in Halifax, NS, Canada, on May 29, 1955. He received the B. Sc. (hons.) and M. Sc. degrees in physics from Dalhousie University, Halifax, in 1977 and 1979. respectively.

In 1979 he joined the Metrology Division of the Bedford Institute of Oceanography, Dartmouth, NS, where he was involved in the design and development of oceanographic instrumentation. He moved to Ottawa in 1981 to join the Canada Centre for Remote Sensing, where his primary area of concern was the upgrading of the Canadian reception and production systems to support the LANDSAT Thematic Mapper program. In 1982 he became a Research Officer in the Division of Physics of the National Research Council of Canada, Ottawa. As a member of the Thermometry and Electrical Standards section, his chief area of interest is in the application of physical principles in instrumentation and measurement.